Record Details     « New Search       Brief Record Full Record MARC Record     Bibliographic Data Control Number UPD-00000485786 Date and Time of Latest Transaction 20090717033135.0 General Information 040709s2003 eng Title Statement Understanding the effect of surface flaws on fracture of silicon die / by Jaime C. Punzalan Jr Main Entry - Personal Name Punzalan, Jaime C. Cataloging Source DML Language Code eng Local Call Number LG 995 2003 M37 P86 Physical Description xi, 99 leaves : ill Subject Added Entry - Topical Term Fracture mechanics   Fractography   Materials -- Cracking -- Measurement   Semiconductor wafers   Silicon crystals Collection Category FI   UP Location UP DARCHIVES LG 995 2003 M37 P86 Regular Circulation UARD-10675T Textual Physical Form Designator Thesis           Physical Location University of the Philippines Diliman Main Library: University Archives LG 995 2003 M37 / P86 Diliman Main Library: University Archives LG 995 2003 M37 P86           Digital Copy Not Available          Add to Book Cart  |   Download MARC