Record Details     « New Search       Brief Record Full Record MARC Record     Bibliographic Data Control Number UPD-00039838007 Date and Time of Latest Transaction 20090717043413.0 General Information 060227s2006 ne a b 001 0 eng International Standard Book Number 0123705975 (hardcover : alk. paper)   9780123705976 Cataloging Source DENGII Local Call Number TK 7874.75 V57 2006 Title Statement VLSI test principles and architectures : design for testability / edited by Laung-Terng Wang, Cheng-Wen Wu, Xiaoqing Wen Physical Description xxx, 777 p. : ill Series Statement/Added Entry - Title The Morgan Kaufmann series in systems on silicon Subject Added Entry - Topical Term Integrated circuits -- Very large scale integration -- Testing   Integrated circuits -- Very large scale integration -- Design Added Entry - Personal Name Wang, Laung-Terng.   Wu, Cheng-Wen, EE Ph. D.   Wen, Xiaoqing. Language Code eng Collection Category FO Format Monograph Location UP DENG-II TK 7874.75 V57 2006 E2000000254 Regular Circulation 2006 E2-327 Textual Physical Form Designator Book           Physical Location University of the Philippines Diliman: College of Engineering Library II TK 7874.75 / V57 2006           Digital Copy Not Available          Add to Book Cart  |   Download MARC