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Control Number11399
Date and Time of Latest Transaction20130920013230.AM
General Information130920s |||||||||b ||00|||
Cataloging SourceSTII-DOST
Language Codeeng
Local Call NumberQC415 D37
Main Entry - Personal NameDelhez, R.
 Mittemeijer, E. J.
Title StatementDiffraction studies of concentration variations : the analysis of X-ray diffraction line broadening and electron diffraction contrast originating from specimens with concentration variations / by Robert Delhez and Eric Jan Mittemeijer
Physical Descriptionxii, 233 p. : ill. ; 24 cm
Subject Added Entry - Topical TermX-rays -- Diffraction
 Electrons -- Diffraction
LocationDOST STII QC415 D37 BOOKS (F) 1005198 1 1979-04-06
Physical Location
Department of Science and Technology
Science and Technology Information InstituteQC415 D37
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