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Control Number77271
Date and Time of Latest Transaction20110811104453.AM
General Information110811s |||||||||b ||00|||
Cataloging SourcePCASTRD-DOST
Language Codeeng
Main Entry - Personal NameMahun, A.H.
 Fleet, M.L.
 Langford, A.A.
Title StatementCorrection for multiple reflections in infrared spectra of amorphous silicon
Physical Description373-383
Summary, Etc.Analysis of IR spectra of thin films such as a-Si:H can yield quantitative compositional information. However, to calculate the integrated absorbances of features in the spectra, multiple internal reflections in the film must be accounted for. In practice, this has been done either by mathematically estimating the degree of multiple reflections or by using substrates designed to eliminate the reflections, typically wedged or roughened c-Si. These techniques are compared on the basis of accuracy and ease of substrate preparation
Subject Added Entry - Topical TermThin films -- Materials science
 IR spectroscopy -- Materials science
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