Record Details     « New Search       Brief Record Full Record MARC Record     Bibliographic Data Control Number 77271 Date and Time of Latest Transaction 20110811104453.AM General Information 110811s |||||||||b ||00||| Cataloging Source PCASTRD-DOST Language Code eng Main Entry - Personal Name Mahun, A.H.   Fleet, M.L.   Langford, A.A. Title Statement Correction for multiple reflections in infrared spectra of amorphous silicon Physical Description 373-383 Summary, Etc. Analysis of IR spectra of thin films such as a-Si:H can yield quantitative compositional information. However, to calculate the integrated absorbances of features in the spectra, multiple internal reflections in the film must be accounted for. In practice, this has been done either by mathematically estimating the degree of multiple reflections or by using substrates designed to eliminate the reflections, typically wedged or roughened c-Si. These techniques are compared on the basis of accuracy and ease of substrate preparation Subject Added Entry - Topical Term Thin films -- Materials science   IR spectroscopy -- Materials science           Physical Location           Digital Copy Not Available          Add to Book Cart  |   Download MARC