Record Details     « New Search       Brief Record Full Record MARC Record     Bibliographic Data 001    76333 005    20110810183016.PM 008    110810s |||||||||b ||00||| 040 ## $aPCASTRD-DOST 041 0# $aeng 100 1# $aLevy, Ben 245 00 $aPutting it together - precisely 300 ## $a126-128 520 3# $aResearchers now have a new nondustructive method to measure stress levels in aluminum thin-film layers deposited on substrates. Using a seven-axis positioning system from Newport Corp. of Irvine, Calif., they can bounce X-rays off any point on the surface of 8-in. semiconductor wafers and measure the angles of the diffracted rays. 650 04 $aSubmicron assembly 650 04 $aMotion system 650 04 $aElectronics 650 04 $aPhotonics and electronic equipment 650 04 $aPhotonics 991 ## $wANALYTICS           Physical Location           Digital Copy Not Available          Add to Book Cart  |   Download MARC