Record Details     « New Search       Brief Record Full Record MARC Record     Bibliographic Data Control Number 77274 Date and Time of Latest Transaction 20110811104449.AM General Information 110811s |||||||||b ||00||| Cataloging Source PCASTRD-DOST Language Code eng Main Entry - Personal Name Ristein, J. Title Statement Excitation spectroscopy of photoluminescence in a-Si:H Physical Description 403-409 Summary, Etc. The photoluminescence (PL) excitation spectrum (intensity of PL as a function of the wavelength of the exciting light) has been measured over the excitation source. At all wavelengths, the PL intensity varies with incident laser power, I, as I0.9 independent of wavelength. The resulting PL excitation spectrum has two distinguishing features, an exponential rise at lower energies followed by a leveling-off above about 1.15eV. Although the precise functional form of the data at low energies is not uniquely determined, the data are consistent with an exponential rise whose slope is the same as that measured in optical absorption at higher energies Subject Added Entry - Topical Term Amorphous silicon -- Materials science   Photoluminescence   Spectroscopy -- Materials science           Physical Location           Digital Copy Not Available          Add to Book Cart  |   Download MARC