Record Details     « New Search       Brief Record Full Record MARC Record     Bibliographic Data 001    UPD-00000177489 005    20090716221815.0 008    080209s1995 caua b 001 0 eng 020 ## $a0126822409 040 ## $aDENG 041 ## $aeng 090 90 $aTK 7871.99$bM44 T36 100 1# $aTakeda, Eiji,$d1944- 245 10 $aHot-carrier effects in MOS devices /$cEiji Takeda, Cary Y. Yang, Akemi Miura-Hamada. 260 ## $aSan Diego :$bAcademic Press,$cc1995. 300 ## $axii, 312 p. 650 #0 $aMetal oxide semiconductors. 650 #0 $aHot carriers. 700 1# $aYang, C. Y.-W.$q(Cary Y. -W.),$d1948- 700 2# $aMiura-Hamada, Akemi. 905 ## $aFO 950 ## $aMonograph 852 ## $aUP$bDENG-II$hTK 7871.99 M44 T36$pudegb0015942$rRegular Circulation$xE-ESEP-2345 842 ## $aBook           Physical Location University of the Philippines Diliman: College of Engineering Library II TK 7871.99 M44 T36           Digital Copy Not Available          Add to Book Cart  |   Download MARC