Record Details     « New Search       Brief Record Full Record MARC Record     Bibliographic Data Control Number UPD-00000176133 Date and Time of Latest Transaction 20090716221359.0 General Information 080209s1989 us 000 eng International Standard Book Number 0306433621 Cataloging Source DENG Language Code Eng Local Call Number QC 611.6 S9 N38 1988 Added Entry - Personal Name Cherns, David Title Statement Evaluation of advanced semiconductor materials by electron microscopy / edited by David Cherns Physical Description xi, 412 p. : ill Subject Added Entry - Topical Term Electron microscopy -- Technique -- Congresses   Electrons -- Diffraction -- Congresses   Semiconductors -- Surfaces -- Congresses Added Entry - Corporate Name North Atlantic Treaty Organization. Scientific Affairs Division   Special Program on Condensed Systems of Low Dimensionality (NATO) Main Entry - Meeting Name NATO Advanced Research Workshop on the Evaluation of Advanced Semiconductor Materials by Electron Microscopy (1988 : Bristol, England) Collection Category FO Format Monograph Location UP DENG QC 611.6 S9 N38 1988 UDEGB0031248 Regular Circulation E-ESEP-0298 Textual Physical Form Designator Book           Physical Location University of the Philippines Diliman: College of Engineering Library I QC 611.6 S9 N38 1988           Digital Copy Not Available          Add to Book Cart  |   Download MARC