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Control Number170265
Date and Time of Latest Transaction20110428095503.AM
General Information110428s |||||||||b ||00|||
Cataloging SourceSTII-DOST
Local Call Number(T) TA1775 I56 2006
Main Entry - Personal NameInnis, Vallerie Ann A.
Title StatementSurface characterization of selected polymer thin films by total-reflection x-ray fluorescence spectroscopy and x-ray reflectivity by Vallerie Ann A. Innis
Physical Descriptionix, 101 leaves illus., graphs, pictures, tables
Summary, Etc.Development of available x-ray characterizations tools for grazing evidence techniques was done to be able to probe nano-size thin films. Alignment of a Philips x-ray power diffractometer was improved to let it perform as an x-ray reflectometer. X-ray reflectometry was coupled with total-reflection x-ray fluorescence spectroscopy. Evaluation of the performance of these grazing incidence techniques was done by preparing polymer thin films of carboxymethylcellulose, carrageenan and polyvinylpyrrolidone (PVP). The thickness of the films were varied by varying the process parameters such as concentration, spin speed and spin time. Angle-dispersive total-reflection x-ray fluorescence spectroscopy profiles of three films showed film formation only in carrageenan and PUP. For both carrageenan and PVP, an increase in concentration yielded a corresponding increase in intensity of the fluorescent or scattered peaks. XRR profiles of carrageenan thin films yielded a mean value for the critical angle close to quartz substrate. Thickness measurements of the prepared carrageenan thin films showed that concentration was the main determinant for final film thickness over the other process parameters. Sulfur fluorescent intensity derived from the TXRF measurement showed a linear relationship with the measured thickness by XRR. For PVP, measured critical angle is lower than quartz. Poor adhesion of the polymer onto the substrate yielded a limited number of thickness measurements made from the XRR profiles
Subject Added Entry - Topical TermPhysics -- Polymer Thin films -- X-ray reflectivity -- Spectroscopy, Fluorescence
 Films, Polymer thin -- X-ray Reflectivity -- Spectroscopy
LocationDOST STII (T) TA1775 I56 2006 THESES Fil(T) STI-11-0053 1 4493-C Complimentary 2011-02-02
  
     
 
Physical Location
Department of Science and Technology
Science and Technology Information Institute(T) TA1775 I56 2006
  
     
 
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