Record Details     « New Search       Brief Record Full Record MARC Record     Bibliographic Data Control Number UPD-00000177303 Date and Time of Latest Transaction 20090716221617.0 General Information 080209 1995 0 0 eng International Standard Book Number 0818662921 Cataloging Source DENG Language Code eng Local Call Number TK 7874.75 T35 Title Statement Manufacturing yield evaluation of VLSI/WSI systems / [edited by Bruno Ciciani] Physical Description x, 437 p Subject Added Entry - Topical Term Integrated circuits -- Very large scale integration -- Design and construction -- Data processing   Integrated circuits -- Wafer-scale integration -- Design and construction -- Data processing   Integrated circuits -- Very large scale integration -- Reliability   Integrated circuits -- Wafer-scale integration -- Reliability   Integrated circuits -- Fault tolerance Added Entry - Personal Name Ciciani, Bruno. Collection Category FO Format Monograph Location UP DENG-II TK 7874.75 T35 UDEGB0015669 Regular Circulation E-ESEP-2073 Textual Physical Form Designator Book           Physical Location University of the Philippines Diliman: College of Engineering Library II TK 7874.75 T35           Digital Copy Not Available          Add to Book Cart  |   Download MARC