Record Details     « New Search       Brief Record Full Record MARC Record     Bibliographic Data Control Number 77275 Date and Time of Latest Transaction 20110811104448.AM General Information 110811s |||||||||b ||00||| Cataloging Source PCASTRD-DOST Language Code eng Main Entry - Personal Name Mauk, P.H.   Sites, J.R. Title Statement Diode quality factor determination for thin-film solar cells Physical Description 411-417 Summary, Etc. A technique is proposed for accurate determination of the diode quality factor for non-ideal photodiodes. It is applied to thin-film polycrystalline solar cells at varying temperatures and intensities. The procedure is to measure the slope of dV/dJ vs. (J+Jl)-1, with correction for shunting effects when necessary. This technique allows one (1) to deal with large deviations from superimposition, (2) to separate unambiruously the illuminated diode quality factor and series resistance, and (3) to recognize easily the onset of current shunting or limiting effects. For reasonably well-behaved polycrystalline cells the diode quality factor uncertainty is +-0.04 Subject Added Entry - Topical Term Thin film -- Materials science   Solar cells           Physical Location           Digital Copy Not Available          Add to Book Cart  |   Download MARC