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Bibliographic Data
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2843
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20130920015840.AM
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$a81000199
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$a0306406543
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$aSTII-DOST
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$aeng
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$aQC482.S6 E9
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$aJoy, David C.,
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$aTeo, B. K.
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$aEXAFS spectroscopy, techniques and applications /$cedited by B.K. Teo and D.C. Joy.
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$aNew York :$bPlenum Press,$cc1981.
300
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$aviii, 275 p. :$bill. ;$c26 cm.
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$aIncludes bibliographical references and index.
650
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$aX-ray spectroscopy.
650
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$aAbsorption spectra.
650
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$aExtended x-ray absorption fine structure.
852
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$aDOST$bSTII$hQC482.S6 E9$jBOOKS$k(F)$p1000835$t1$x9-780$yC$11983-03-07
991
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$wBOOKS
 
     
 
Physical Location
Department of Science and Technology
Science and Technology Information InstituteQC482.S6 E9
 
     
 
Digital Copy
Not Available
 
     
 
         
         
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