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Bibliographic Data
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311487
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20150706093117.AM
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040
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$aSTII-DOST
090
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$aScienceDirect
100
1#
$a Chian-Feng Yen
100
1#
$a Cheeseman, Bryan A.
100
1#
$a Swneson, Daniel
100
1#
$aYuyang Miao
100
1#
$aYouqi Wang
100
1#
$a LaMaltina, Bruce
245
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$aDigital element approach for simulating impact and penetration of textiles$cby Youqi Wang and 5 others
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$aAmsterdam$bElsevier Ltd.$c2009
300
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$apages 552-560$bcomputer file; text; 1,157kb
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$aIncludes bibliographical references
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3#
$aA micro-scale computational tool, based upon an explicit digital element method (DEM), has been developed for numerical simulation of ballistic impact and penetration of textile fabrics. In this approach, each yarn is digitized as an assembly of digital fibers. Each digital fiber is further digitized into a short digital rod element chain connected by frictionless pins (nodes). A search is conducted to find contacts between adjacent digital fibers. If a contact is detected, compressive and frictional forces between fibers will be determined, based upon contact stiffness and friction coefficient. Nodal forces are calculated for each time step. Nodal displacements are determined using an explicit procedure. Because the digital element approach operates on a sub-yarn micro-scale, one can determine textile penetration resistance based upon sub-yarn scale properties, such as inter-fiber compression, friction, and fiber strength. Research presented in this paper includes three parts. First, the explicit digital element algorithm used in dynamic simulation is explained. Second, the approach is used to generate 2-D woven fabric micro-geometries and to simulate ballistic penetration processes. Third, numerical results are compared to high resolution experimental impact and ballistic test data.
650
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$aEngineering
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$aTextile industry
650
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$aEngineering Services
650
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$aEngineering and manufacturing industries
852
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$aDOST$bSTII$hScienceDirect$jNONPRINTS$kNP$p14-15538$t1$x14-15538$yOnline/Download$12012-01-12
991
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$wNONPRINTS
  
     
 
Physical Location
Department of Science and Technology
Science and Technology Information InstituteScienceDirect
  
     
 
Digital Copy
Not Available
  
     
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