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Your search for [subject]Integrated circuits -- Testing returned 10 records. |
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Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits.
by Bushnell, Michael L., (Michael Lee), 1950-; New York, N.Y.: Springer, 2000.
Subject: Integrated circuits -- Very large scale integration -- Testing; Digital integrated circuits -- Testing; Mixed signal circuits -- Testing; Semiconductor storage devices -- Testing.
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LSI/ VLSI testability design.
by Tsui, Frank F.; New York: McGraw-Hill Book Company, 1988.
Subject: Science and technology; Integrated circuits -- Large scale integration -- Testing; Electronic equipment -- Large scale integrated circuits -- Testing.
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Digital integrated circuits : design-for-test using Simulink and Stateflow _ Design-for-test using Simulink and Stateflow.
by Perelroyzen, Evgeni; Boca Raton, FL: CRC Press, 2007.
Subject: Digital integrated circuits -- Testing; Digital integrated circuits -- Design and construction; SIMULINK; MATLAB.
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Analog and mixed signal test.
Upper Saddle River, NJ: Prentice-Hall PTR, 1998.
Subject: Linear integrated circuits -- Testing; Mixed signal circuits -- Testing.
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Digital systems testing and testable design.
by Friedman, Arthur D.; New York: IEEE Press, 1990.
Subject: Digital integrated circuits - Design and construction; Digital integrated circuits - Testing.
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Principles of semiconductor network testing.
by Afshar, Amir; Boston: Butterworth-Heinemann, 1995.
Subject: Integrated circuits -- Testing; Semiconductors -- Testing.
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Design to test : a definitive guide for electronic design, manufacture, and service.
by Turino, Jon L.; New York: Van Nostrand Reinhold, 1990.
Subject: Integrated circuits -- Testing.
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Analog signal generation for built-in-self-test of mixed-signal integrated circuits.
by Roberts, Gordon W., 1959-; Boston: Kluwer Academic Publishers, 1995.
Subject: Integrated circuits -- Design and construction; Integrated circuits -- Testing; Signal generators -- Design and construction; Signal processing -- Digital techniques.
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Digital integrated circuit testing from a quality perspective.
by Hnatek, Eugene R.; New York: Van Nostrand, 1993.
Subject: Digital integrated circuits -- Testing -- Quality control.
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Automatic testing and evaluation of digital integrated circuits.
by Healy, James Thomas, 1940-; Reston, Va.: Reston Pub. Co., 1981.
Subject: Digital integrated circuits -- Testing; Automatic test equipment.
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