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  Search result  Your search for [subject]Semiconductor storage devices -- Testing returned 1 record.  
     
  Book Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits.

by Bushnell, Michael L., (Michael Lee), 1950-; New York, N.Y.: Springer, 2000.

Subject: Integrated circuits -- Very large scale integration -- Testing; Digital integrated circuits -- Testing; Mixed signal circuits -- Testing; Semiconductor storage devices -- Testing.

 
     
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