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  Search result  Your search for [subject]Spectral reflectance returned 2 records.  
 
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  Thesis Characterization of semiconductor devices via spectral reflectance and two-photon optical beam-induced current microscopy.

by Bautista,Gedofredo S.; 2006.

Subject: Semiconductors; Spectral reflectance; Reflectance; Diodes, Semiconductor; Light emitting diodes.

  
     
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  Thesis Characterization of semiconductor devices via spectral reflectance and two-photon optical beam-induced current microscopy.

by Bautista, Godofredo S. Jr.; 2006.

Subject: Physics; Semiconductor; Spectral reflectance microscopy; Inherent axial resolution.

  
     
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