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  Search result  Your search for [subject]Integrated circuits -- Wafer-scale integration -- Reliability returned 1 record.  
     
  Book Manufacturing yield evaluation of VLSI/WSI systems.

Los Alamitos, CA: IEEE Computer Society Press, 1995.

Subject: Integrated circuits -- Very large scale integration -- Design and construction -- Data processing; Integrated circuits -- Wafer-scale integration -- Design and construction -- Data processing; Integrated circuits -- Very large scale integration -- Reliability; Integrated circuits -- Wafer-scale integration -- Reliability; Integrated circuits -- Fault tolerance.

 
     
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